BERTWave MP2110A Cuts Evaluation Time and Production Costs of Optical Modules with Simultaneous BER Measurements and Eye Pattern Analysis

Luton, United Kingdom – February 22, 2017 – Anritsu Corporation has launched the new BERTWave MP2110A series which is optimized for manufacturing inspection of 100-Gbit/s multi-channel optical modules. The newly added BERTWave MP2110A is an all-in-one instrument targeted at simultaneous BER (Bit Error Rate) measurements and Eye Pattern Analysis required for evaluation of optical modules and devices used in optical communications systems, including 100 GbE, InfiniBand EDR and 32G Fibre Channel.

As data traffic volumes and users demand for unique services continue to grow, providers are constantly under pressure to improve the processing power of data-center systems, while keeping a hold on the resulting cost rises. A recent solution has been to increase the bit rates of optical modules used in data centers from 10G to 25G. The new all-in-one BERTWave MP2110A is designed to meet these changing needs. Not only does the all-in-one MP2110A design cut instrument capital costs, but high-speed sampling shortens measurement times, and the high-sensitivity Error Detector performance improves yields to help slash optical modules and devices production costs.

Unlike previous measurement environments requiring two separate instruments for measuring the BER and analyzing Eye Patterns, the MP2110A supports simultaneous measurements, saving equipment installation space. In addition, to shorten tact times on optical modules and devices production lines, the MP2110A maximum sampling speed has been increased to 250 ksamples/s, slashing Eye Pattern Analysis times for Eye Mask tests by 75% compared to earlier instruments. The MP2110A also supports options for expanding the built-in Bit Error Rate Tester (BERT) to 4ch at up to 28.2 Gbit/s, and the built-in sampling oscilloscope to 2ch. As a result, the MP2110A can perform simultaneous TRx BER measurements of multi-channel optical modules, such as QSFP28, and simultaneous 2ch Eye pattern analyses, dramatically reducing measurement times by up to 65% compared to previous measurement systems.

And with a minimum sensitivity of –15 dBm (typ. SMF), the sampling oscilloscope optical interface supports accurate Eye Pattern Analysis of signals that have been attenuated by switches, etc. The excellent PPG Jitter performance of only 600 fs rms (typ.) and ED sensitivity of 25 mV (typ.) also support measurement with better performance than the device under test (DUT).